Professional experiences Pascal Gounet

SMTS - Physical Failure Analysis Principal Engineer
Grenoble jan 2011 - now

Achievement/success in the last 3 years

ST/WW full evaluation of FIB-SEM Gallium TESCAN systems. Result will be a reference guide to help lab managers & engineers choosing their own tool.
Circuit Edit new generation of tool: work in parallel with 2 main suppliers (ThermoFischer – former FEI & TESCAN) to develop tool allowing circuit edit of FE technologies from 28nm (FDSOI, cmos) down to FinFET 5nm.

Technical and managerial strengths

Technical knowledge on Physical FA as Electronic microscopy (SEM, S/TEM), Focused Ion Beam (FIB, PFIB), X-Rays, Material analyses / characterization, Chemistry – dry (plasma) ones and wet ones, LASER, Front-End and Back-End processes, Sample preparation…
External contacts with suppliers, peers & others labs
Internal contact with ST FA community

Development areas

Even if started through some projects or suppliers management, need / want to have more influence and contribute more to technical plans at company level
Anticipate future of physical FA (for FinFET technology as an example) and being able to solve problems directly with external suppliers
Enhanced ST image as top-leader company through conference, technical committee, publications…
Reinforce my position as expert in Physical FA

Career aspirations

Discussing with my management I am well positioned as of today. My “aspirations” are directly linked to my development areas improving ST & myself contribution for all-day work into FA labs.

Requested as « member of technical committee » for the CAM2018 workshop
Germany jan 2018

Suspendisse ut elit at arcu efficitur scelerisque at eget odio.

Mauris volutpat velit pulvinar semper posuere. Duis vel purus odio. Nullam id consectetur metus. Morbi sollicitudin mollis ex eget scelerisque. Lorem ipsum dolor sit amet, consectetur adipiscing elit. Suspendisse ut elit at arcu efficitur scelerisque at eget odio.